Analysis of IC Defects

High Voltage Microprocessor Test Escapes An Analysis of Defects Our Tests are Missing
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. for the Pentium II Single Edge Computer Cartridge is shown in Figure 4. Every step in the process
can induce new defects or expose previously tested yet undetected or marginal defects. For
non-car- tridge components, ie, the ones packaged in a traditional IC package, the flow